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Disabling the Multi-Burst Technology for DDR2 Devices during the Auto Loop Test
INN-8668-APN32
--Created 4-16-09
We have found from our own research and from input from our customers that some DDR2 devices are still sensitive to the Multi-Burst technology during the Auto Loop burn-in phase. If you encounter a DDR2 device that fails during the Auto Loop burn-in you can always disable the Multi-Burst Mode during the Auto Loop. We will be addressing this in a future firmware revision.
To disable the Multi-Burst Mode, simply turn RAMCHECK or RAMCHECK LX the unit on, and once it finishes its boot up sequence and is in Standby mode press the following key sequence:
1. F2 for SETUP
2. F2 for TESTFLOW
3. F3 for EDIT TEST
4. F5 for NEXT
5. F2 for MULTI-BURST
6. F4 to highlight "Disable Multi-Burst during Auto loop"
7. F1 to Enter Next press the ESC key four times to save it.
You should see "Saving to EEPROM" flash on the LCD screen. You can confirm that it is saved by pressing F2 for SETUP, then F3 for LIST SETUP.
You can re-enable the Multi-Burst by following the steps above except in step 6 press F3 to highlight "Enable Multi-Burst.” You can also reset the tester to AUTO/DEFAULT by pressing F2 for Setup, then F4 for Auto. This will return all of the setup parameters to their default settings.
If you still having test issues after you disabling the Multi-Burst during the AUTO Loop, please contact our technical support department at (281) 879-6226 M-F 9:00-5:00 Central Time, or send your E-mail to support@innoventions.com, or fax your message to (281) 879-6415. Please remember to include your phone and e-mail.