|RAMCHECK LX Testers
RAMCHECK LX DDR3
RAMCHECK LX DDR1
RAMCHECK LX Base Tester
204-pin DDR3 SO-DIMM converter
200-pin DDR2 SO-DIMM adapter
200-pin DDR2 SO-DIMM
184-pin DDR Pro
200-pin DDR SO-DIMM
100-pin DDR SODIMM
66-pin DDR Chip
200-pin Sun DIMM
50-pin EDO TSOP
PC Communication Software
Which System Is For Me?
Why Buy From Us?
Why Test Memory?
Service & Upgrades
Contact us at
RAMCHECK/RAMCHECK LX DDR3 240-pin adapter
RAMCHECK DDR3 Adapter (p/n INN-8668-16) is the latest test adapter for
the RAMCHECK LX and
RAMCHECK. It supports testing of 240-pin
PC3-6400, PC3-8500, PC3-10600, and PC3-12800 DDR3 memory, including unbuffered
(UDIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with
The DDR3 adapter plugs into the existing RAMCHECK or
RAMCHECK LX base tester. This makes the DDR3 adapter by far the most
cost-effective solution for testing modern high-speed DDR3 modules. In fact,
its features are what you would expect to find in test equipment that costs
$20,000 or more.
Don't let the adapter's small
size fool you! High speed operations require short connections, while the
adapter is loaded with state-of-the-art electronic components.
No special setup is required. As with all of our
products, the adapter is extraordinarily simple to use. Insert the adapter,
turn the RAMCHECK/RAMCHECK LX tester on, place a module into the test socket,
then press the start button.
have incorporated state-of-the-art technology in the design of the new RAMCHECK
| DDR3 Advanced
controller featuring our improved 1066MHz test engine.
efficiency switching power regulator to generate the DDR3 STTL-15 interface
analog section for measuring the module's current, voltages and the board's
||Digitally-controlled Vtt regulator.
||400-1333MHz DDR3 clock generator.
||Digitally-controlled high resolution VDD high efficiency switching
The RAMCHECK DDR3 adapter
includes many new features which are relevant to the differences between DDR3
technology and the older DDR2 and DDR technology.
As with all of our RAMCHECK/RAMCHECK LX testers,
each module's size, structure, and type are automatically detected, without the
need for user's setup. The test flow follows our standard Basic Test, Extensive
Test, and Auto-Loop process. The RAMCHECK DDR3 adapter is very simple to
operate, with little training or setup required.
The new DDR3 incorporate
numerous enhancement over our previous DDR2 technology, some of which are
currently implement in the diagnostic tests and will be fully enabled in
upcoming firmware versions. Please make sure that your base tester (RAMCHECK LX
or RAMCHECK) always has the latest firmware installed.
Please note that the following technical specifications are subject to change
while we introduce this new DDR3 technology.
the RAMCHECK DDR3
||RAMCHECK automatically identifies the presence of the
new DDR3 adapter.
||RAMCHECK prompts the user to insert a 240-pin DDR3
module and start the test with F1.
| BASIC TEST
||Basic Test screen shows the size, the speed, the
voltage, the test pattern, the module's bank and the CAS Latency. This example
shows testing at 1066MHz with an automatic setting of CAS Latency to the
default value of CL=6 for this frequency.
||This screen appears upon a successful completion of the
Basic Test. It is followed with several detailed screens with detailed
information about the module's size and structure.
||This sample structure information screen indicates that
the module was tested at the default 1.50V. CAS Latency was the automatically
selected value of CL=6. Other values may be selected automatically (or by the
user) for different frequencies.
| PARAMETERS, CHANGE-ON-THE-FLY AND SETUP
||Expanded CHANGE-ON-THE-FLY can be used to set up the
Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the
current test. Following the current test, it returns to the current setup
||Here we demonstrate how the module's frequency is
overriden to 866MHz from a previous test at 800MHz.
||CAS Latency can be set at 5,6,7,8,9,10,11, and 12.
Please note that not all DDR3 modules support all CL values.
|| Various Rtt_NOM and Rtt_WR (dynamic Rtt) can be set up
by the user.
||The DDR3 VDD Voltage setup allows the user to change
on-the-fly the test voltage in the range 1.35V-1.8V. When set to AUTO, RAMCHECK
automatically tests the module at 1.5V/1.6V. In this example, the user is
selecting a VDD of 1.57 Volt.
| WIRING ERRORS DETECTION
||The DDR3 devices utilize the differential DQS technique
which assigns a pair of two control lines per each DQS. In this test error
example, DQS4 line (pin 84) was stuck at 1.
||Address lines errors in the DDR3 modules are reported
explicitly as shown in this example. Here address line A2 (pin 61) is shorted
||The DDR3 module uses ODT control lines to activate the
internal Rtt termination resistors. In this test error example, line ODT0 (pin
195) is shorted to ground.
| EXTENSIVE TEST
||During Voltage Cycling, the module is tested at various
voltages, which are automatically selected based on the current frequency.
Higher frequencies require higher voltages.
|DDR3 Test Features
Length of 8, BC4 or 8 and BC4.
|Supports both Read CAS LATENCY (CL) and Write CAS LATENCY (CWL) in
the range of 5,6,7,8,9,10,11, and 12. Supports Additive Latency of 0, CL-1 and
CL-2. Trcd is supported in the range of 4,5,6,7,8,9 and 10. Default test allows
automatic selection of CL and CWL for different test phases. The user can
select specific CL values using SETUP or the CHANGE-ON-THE-FLY
circuitry and DCMs provides write leveling tests as well as differential delays
along the input data path.
|Support On-Die-Termination (ODT) including Rtt_NOM and dynamic ODT
|DDR3 Data rates :
800MHz and 1066MHz. Test engine reaches 1333Mhz on some tests. Higher speed
DDR3 modules can still be tested at a lower frequency, as described below.
|Supports new DDR3 reset function and the mode registers
|Test engine implement improved SRE (Self Refresh Entry) command as
well as the new DDR3 long and short calibration commands (ZQCL/ZQCS).
|Improved current and temperature measurement circuitry.
|True 1.5V testing
with a wide support range of 1.35V to 1.8V at 10mV increments.
|Controlled Vtt for true STTL-15 compatibility.
|Parallel testing capability of 64/72-bits.
|Rugged, 240-pin test-quality ZIF socket for convenient module
|Automatic detection and support for Registered/Unbuffered
|Automatic DQS8..0/DM8..0 or DQS17..0 support.
|Four -S control lines for up to 4-rank devices.
|Fourteen A15..0 address lines and three BA2..0 bank select address
lines to support 16GB modules.
|Complete SPD programming support.
|Supports converter for 204-pin S.O. DIMM modules and other future
When ordering, please
reference RAMCHECK DDR3 Adapter part number: INN-8668-16. Please note that
older RAMCHECK base testers may require a hardware upgrade in order to use the
DDR3 adapter. Please refer to this RAMCHECK upgrade
page for more details.
DDR3 Frequency Support
The new RAMCHECK DDR3 adapter can perform DDR3
tests at actual test frequencies up to 1066MHz. Modules designed for 1333MHz
and 1600MHz (as well as future DDR3-1800, 1866, 2000, etc.) can be functionally
tested on the DDR3 adapter but at a reduced frequency. The DDR3 test engine can
achieve 1333MHz internal diagnostic speeds. Please see the product
specifications for further details.
|RAMCHECK DDR3 Coverage
|Test at full
||Test at full
||Test at lower
||Test at lower