RAMCHECK LX Testers RAMCHECK LX DDR3/2 RAMCHECK LX DDR3 RAMCHECK LX DDR2 RAMCHECK LX DDR1 RAMCHECK LX Base Tester Optional Adapters 240-pin DDR3 204-pin DDR3 SO-DIMM converter 240-pin DDR2 200-pin DDR2 SO-DIMM adapter 200-pin DDR2 SO-DIMM converter 184-pin DDR Pro 200-pin DDR SO-DIMM converter 100-pin DDR SODIMM DIMMCHECK 168 66-pin DDR Chip DDR2 MiniDIMM 144-pin SO-DIMM 100-pin SO-DIMM SDRAM Chip 200-pin Sun DIMM 50-pin EDO TSOP EDO/FPM SOJ 72-pin SODIMM 30/72-pin SIMM PC Communication Software Product FAQ RAMCHECK Testers Which System Is For Me? Why Buy From Us? Why Test Memory? Int'l Distributors How to Purchase Tech Support Service & Upgrades Manuals Software Downloads FAQ Site Map Home Contact us at (281) 879-6226 sales@innoventions.com

RAMCHECK/RAMCHECK LX DDR3 240-pin adapter The RAMCHECK DDR3 Adapter (p/n INN-8668-16) is the latest test adapter for the RAMCHECK LX and RAMCHECK. It supports testing of 240-pin PC3-6400, PC3-8500, PC3-10600, and PC3-12800 DDR3 memory, including unbuffered (UDIMM) and registered modules (RDIMM), both ECC and non-ECC, that comply with JEDEC standards. The DDR3 adapter plugs into the existing RAMCHECK or RAMCHECK LX base tester. This makes the DDR3 adapter by far the most cost-effective solution for testing modern high-speed DDR3 modules. In fact, its features are what you would expect to find in test equipment that costs $20,000 or more. Don't let the adapter's small size fool you! High speed operations require short connections, while the adapter is loaded with state-of-the-art electronic components. No special setup is required. As with all of our products, the adapter is extraordinarily simple to use. Insert the adapter, turn the RAMCHECK/RAMCHECK LX tester on, place a module into the test socket, then press the start button. We have incorporated state-of-the-art technology in the design of the new RAMCHECK DDR3 Adapter.        DDR3 Advanced Technology  1. Main controller featuring our improved 1066MHz test engine. 2. High efficiency switching power regulator to generate the DDR3 STTL-15 interface power source. 3. Advanced analog section for measuring the module's current, voltages and the board's temperature. 4. Digitally-controlled Vtt regulator. 5. 400-1333MHz DDR3 clock generator. 6. Digitally-controlled high resolution VDD high efficiency switching power regulator. The RAMCHECK DDR3 adapter includes many new features which are relevant to the differences between DDR3 technology and the older DDR2 and DDR technology. As with all of our RAMCHECK/RAMCHECK LX testers, each module's size, structure, and type are automatically detected, without the need for user's setup. The test flow follows our standard Basic Test, Extensive Test, and Auto-Loop process. The RAMCHECK DDR3 adapter is very simple to operate, with little training or setup required. Introducing the RAMCHECK DDR3 RAMCHECK automatically identifies the presence of the new DDR3 adapter. RAMCHECK prompts the user to insert a 240-pin DDR3 module and start the test with F1.    BASIC TEST Basic Test screen shows the size, the speed, the voltage, the test pattern, the module's bank and the CAS Latency. This example shows testing at 1066MHz with an automatic setting of CAS Latency to the default value of CL=6 for this frequency. This screen appears upon a successful completion of the Basic Test. It is followed with several detailed screens with detailed information about the module's size and structure. This sample structure information screen indicates that the module was tested at the default 1.50V. CAS Latency was the automatically selected value of CL=6. Other values may be selected automatically (or by the user) for different frequencies.    PARAMETERS, CHANGE-ON-THE-FLY AND SETUP Expanded CHANGE-ON-THE-FLY can be used to set up the Frequency, the Voltage, the CAS LATENCY and the Refresh rate only for the current test. Following the current test, it returns to the current setup parameters. Here we demonstrate how the module's frequency is overriden to 866MHz from a previous test at 800MHz. CAS Latency can be set at 5,6,7,8,9,10,11, and 12. Please note that not all DDR3 modules support all CL values. Various Rtt_NOM and Rtt_WR (dynamic Rtt) can be set up by the user. The DDR3 VDD Voltage setup allows the user to change on-the-fly the test voltage in the range 1.35V-1.8V. When set to AUTO, RAMCHECK automatically tests the module at 1.5V/1.6V. In this example, the user is selecting a VDD of 1.57 Volt.    WIRING ERRORS DETECTION The DDR3 devices utilize the differential DQS technique which assigns a pair of two control lines per each DQS. In this test error example, DQS4 line (pin 84) was stuck at 1. Address lines errors in the DDR3 modules are reported explicitly as shown in this example. Here address line A2 (pin 61) is shorted to ground. The DDR3 module uses ODT control lines to activate the internal Rtt termination resistors. In this test error example, line ODT0 (pin 195) is shorted to ground.    EXTENSIVE TEST During Voltage Cycling, the module is tested at various voltages, which are automatically selected based on the current frequency. Higher frequencies require higher voltages. The new DDR3 incorporate numerous enhancement over our previous DDR2 technology, some of which are currently implement in the diagnostic tests and will be fully enabled in upcoming firmware versions. Please make sure that your base tester (RAMCHECK LX or RAMCHECK) always has the latest firmware installed. Please note that the following technical specifications are subject to change while we introduce this new DDR3 technology. DDR3 Test Features Supports Burst Length of 8, BC4 or 8 and BC4. Supports both Read CAS LATENCY (CL) and Write CAS LATENCY (CWL) in the range of 5,6,7,8,9,10,11, and 12. Supports Additive Latency of 0, CL-1 and CL-2. Trcd is supported in the range of 4,5,6,7,8,9 and 10. Default test allows automatic selection of CL and CWL for different test phases. The user can select specific CL values using SETUP or the CHANGE-ON-THE-FLY feature. Advanced timing circuitry and DCMs provides write leveling tests as well as differential delays along the input data path. Support On-Die-Termination (ODT) including Rtt_NOM and dynamic ODT with Rtt_WR. DDR3 Data rates : 800MHz and 1066MHz. Test engine reaches 1333Mhz on some tests. Higher speed DDR3 modules can still be tested at a lower frequency, as described below. Supports new DDR3 reset function and the mode registers enhancements. Test engine implement improved SRE (Self Refresh Entry) command as well as the new DDR3 long and short calibration commands (ZQCL/ZQCS). Improved current and temperature measurement circuitry. True 1.5V testing with a wide support range of 1.35V to 1.8V at 10mV increments. Controlled Vtt for true STTL-15 compatibility. Parallel testing capability of 64/72-bits. Rugged, 240-pin test-quality ZIF socket for convenient module handling. Automatic detection and support for Registered/Unbuffered modules. Automatic DQS8..0/DM8..0 or DQS17..0 support. Four -S control lines for up to 4-rank devices. Fourteen A15..0 address lines and three BA2..0 bank select address lines to support 16GB modules. Complete SPD programming support. Supports converter for 204-pin S.O. DIMM modules and other future converters. When ordering, please reference RAMCHECK DDR3 Adapter part number: INN-8668-16. Please note that older RAMCHECK base testers may require a hardware upgrade in order to use the DDR3 adapter. Please refer to this RAMCHECK upgrade page for more details. DDR3 Frequency Support The new RAMCHECK DDR3 adapter can perform DDR3 tests at actual test frequencies up to 1066MHz. Modules designed for 1333MHz and 1600MHz (as well as future DDR3-1800, 1866, 2000, etc.) can be functionally tested on the DDR3 adapter but at a reduced frequency. The DDR3 test engine can achieve 1333MHz internal diagnostic speeds. Please see the product specifications for further details. RAMCHECK DDR3 Coverage PC3-6400 PC3-8500 PC3-10600 PC3-12800 DDR3-800Mhz DDR3-1066Mhz DDR3-1333Mhz DDR3-1600Mhz Test at full frequency Test at full frequency Test at lower frequency Test at lower frequency

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